Characterization and mechanism of He plasma pretreatment of nanoscale polymer masks for improved pattern transfer fidelityFlorian WeilnboeckD. Metzleret al.2011Applied Physics Letters
27 Nov 2023US11830807Placing Top Vias At Line Ends By Selective Growth Of Via Mask From Line Cut Dielectric
01 Aug 2022US11404317Method For Fabricating A Semiconductor Device Including Self-aligned Top Via Formation At Line Ends