Mapping and statistical analysis of filaments locations in amorphous HfO2 ReRAM cells
- Franco Stellari
- Ernest Y. Wu
- et al.
- 2023
- Microelectronics Reliability
Publications
44 results at Microelectronics Reliability
Controversial issues in negative bias temperature instability
- James H. Stathis
- Souvik Mahapatra
- et al.
- 2018
- Microelectronics Reliability
Breakdown data generation and in-die deconvolution methodology to address BEOL and MOL dielectric breakdown challenges
- F. Chen
- Carole Graas
- et al.
- 2015
- Microelectronics Reliability
Long-term NBTI degradation under real-use conditions in IBM microprocessors
- Pong-Fei Lu
- Keith A. Jenkins
- et al.
- 2014
- Microelectronics Reliability
Electromigration challenges for advanced on-chip Cu interconnects
- Baozhen Li
- Cathryn Christiansen
- et al.
- 2014
- Microelectronics Reliability
On-chip circuit to monitor long-term NBTI and PBTI degradation
- Keith A. Jenkins
- Pong-Fei Lu
- 2013
- Microelectronics Reliability
Including spatial correlations of channel length and threshold voltage variation in circuit simulations
- Josef Watts
- Henry Trombley
- 2012
- Microelectronics Reliability
Thermal fracture toughness measurement for underfill during temperature change
- Soojae Park
- Claudius Feger
- 2011
- Microelectronics Reliability
Reliability of advanced high-k/metal-gate n-FET devices
- J.H. Stathis
- M. Wang
- et al.
- 2010
- Microelectronics Reliability
Impacts of NBTI and PBTI on SRAM static/dynamic noise margins and cell failure probability
- Aditya Bansal
- Rahul Rao
- et al.
- 2009
- Microelectronics Reliability