Conference paper
Analyzing path delays for accelerated testing of logic chips
Emily Ray, Barry P. Linder, et al.
IRPS 2015
In spite of 50 years of history, there is still no consensus on the basic physics of Negative Bias Temperature Instability. Two competing models, Reaction-Diffusion and Defect-Centric, currently vie for dominance. The differences appear fundamental: one model holds that NBTI is a diffusion-limited process and the other holds that it is reaction-limited. Basic issues of disagreement are summarized and the main controversial aspects of each model are reviewed and contrasted.
Emily Ray, Barry P. Linder, et al.
IRPS 2015
Narendra Parihar, Richard G. Southwick, et al.
IEEE T-ED
Barry P. Linder, James H. Stathis, et al.
IRPS 2003
Salvatore Lombardo, James H. Stathis, et al.
Journal of Applied Physics