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IEEE Topical Meeting EPEPS 2005
Conference paper

Losses caused by roughness of metallization in printed-circuit boards

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Abstract

In this paper the effect of metal roughness on the total loss, the extracted tanδ, and signal integrity of typical interconnections found in printed-circuit boards is extracted from measurements on three different materials. The differing characteristics of the roughened metal cross sections are highlighted, and a simplified, practical, two-dimensional, causal, broadband modeling methodology is shown. © 2005 IEEE.

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IEEE Topical Meeting EPEPS 2005

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