Estimating transistor channel temperature using time-resolved and time-integrated NIR emission
- Franco Stellari
- Alan J. Weger
- et al.
- 2018
- IRPS 2018
Conference paper
Publications
9 results at IRPS 2018
Lateral profiling of HCI induced damage in ultra-scaled FinFET devices with Id-Vd characteristics
- Miaomiao Wang
- Richard G. Southwick
- et al.
- 2018
- IRPS 2018
Conference paperEffect of HCI degradation on the variability of MOSFETS
- C. Zhou
- Keith A. Jenkins
- et al.
- 2018
- IRPS 2018
Conference paperFuture on-chip interconnect metallization and electromigration
- C. K. Hu
- James Kelly
- et al.
- 2018
- IRPS 2018
Conference paperElectromigration characteristics of power grid like structures
- Baozhen Li
- Andrew Kim
- et al.
- 2018
- IRPS 2018
Conference paperElapsed-time statistics of successive breakdown in the presence of variability for dielectric breakdown in BEOL/MOL/FEOL applications
- Ernest Y. Wu
- Andrew Kim
- et al.
- 2018
- IRPS 2018
Conference paperReliability benefits of a metallic liner in confined PCM
- Wanki Kim
- S. Kim
- et al.
- 2018
- IRPS 2018
Conference paperPBTI in InGaAs MOS capacitors with Al2O3/HfO2/TiN gate stacks: Interface-state generation
- Eduard Cartier
- Martin M. Frank
- et al.
- 2018
- IRPS 2018
Conference paperThe physics of NBTI: What do we really know?
- 2018
- IRPS 2018
Conference paper