Enterprise-Class Cache Compression Design
- Alper Buyuktosunoglu
- David Trilla Rodriguez
- et al.
- 2024
- HPCA 2024
Publications
802 results for Semiconductors
Baking Disaster-Proof Kubernetes Applications with Efficient Recipes
- Runyu Jin
- Paul Muench
- et al.
- 2024
- FAST 2024
Novel ellipsometry-based machine learning technique for characterization of low sensitivity critical dimensions within gate-all-around transistors
- Houssam Chouaib
- Valeria Dimastrodonato
- et al.
- 2024
- SPIE Advanced Lithography + Patterning 2024
Large Feature Wafer Level In-Line Optical Metrology Techniques for Advanced Packaging Schemes
- Katherine Sieg
- Chris Bottoms
- et al.
- 2024
- SPIE Advanced Lithography + Patterning 2024
EUV patterned gate variation reduction in next generation transistor architectures
- Gopal Kenath
- Martin Burkhardt
- et al.
- 2024
- SPIE Advanced Lithography + Patterning 2024
Spectral Interferometry for TSV Metrology in Chiplet Technology
- Stefan Schoeche
- Daniel Schmidt
- et al.
- 2024
- SPIE Advanced Lithography + Patterning 2024
From Lab to Fab - In-line SIMS for Process Control in Nanosheet Gate-All-Around Device Manufacturing
- Stefan Schoeche
- Katherine Sieg
- et al.
- 2024
- SPIE Advanced Lithography + Patterning 2024
EUV Double Patterning Solution for Subtractive Metal Patterning at 18nm Pitch
- Chris Penny
- Koichi Motoyama
- et al.
- 2024
- SPIE Advanced Lithography + Patterning 2024
Complex Chemical Reaction Networks for Future Information Processing
- 2024
- Frontiers in Neuroscience
Backend - CMOS compatible devices for beyond CMOS
- Valeria Bragaglia
- Tommaso Stecconi
- et al.
- 2024
- Neuronics 2024