Nonuniform Displacement of MOSFET Channel PinchoffSavvas G. ChamberlainAsim Husainet al.1984IEEE T-ED
Method for Determining the Emitter and Base Series Resistances of Bipolar TransistorsTak H. NingDenny D. Tang1984IEEE T-ED
IIA-6 Sensitivity of Threshold Voltage and Sheet Carrier Concentration to Material and Electronic Parameters in a HEMT DeviceSandip Tiwari1983IEEE T-ED
A Study of Projected Optical Images for Typical IC Mask Patterns Illuminated by Partially Coherent LightAlbert C. LiuBurn Jeng Lin1983IEEE T-ED
Transient Electronic Transport in InP Under the Condition of High-Energy Electron InjectionKevin BrennanKarl Hesset al.1983IEEE T-ED
A General Solution Method for Two-Dimensional Nonplanar OxidationDaeje ChinSoo-Young Ohet al.1983IEEE T-ED
VA-8 Germanium MISFETs Exhibiting Low Interface State Density Using Ge3N4 Gate InsulatorJames J. Rosenberg1983IEEE T-ED