Characterization of electron traps in SiO2 as influenced by processing parameters
- D.R. Young
- 1981
- Journal of Applied Physics
Publications
Date
Featured collections
Popular topics
2357 results at Journal of Applied Physics
A comparison of static and dynamic properties of one-dimensional magnets and corresponding sG system
- J.M. Loveluck
- T. Schneider
- et al.
- 1981
- Journal of Applied Physics
Micromagnetics of periodic stripe domains
- Yih-O Tu
- 1981
- Journal of Applied Physics
Ion beam oxidation
- J.M.E. Harper
- M. Heiblum
- et al.
- 1981
- Journal of Applied Physics
Barrier heights at the polycrystalline silicon-SiO2 interface
- T.W. Hickmott
- R.D. Isaac
- 1981
- Journal of Applied Physics
The behavior of dislocations in GaAs substrates during the growth of GaxAl1-xAs epitaxial layers
- H. Booyens
- J.H. Basson
- et al.
- 1981
- Journal of Applied Physics
The saturation magnetostriction of permalloy films
- E. Klokholm
- J.A. Aboaf
- 1981
- Journal of Applied Physics
Some magnetic properties of Mn-Zn ferrite epitaxial layers
- D.A. Herman Jr.
- T.S. Plaskett
- 1981
- Journal of Applied Physics
Thermal stability of Pb-alloy Josephson junction electrode materials. II. Effects of SiO coating on Pb-In-Au base electrode
- Masanori Murakami
- 1981
- Journal of Applied Physics
Effects of avalanche injection of electrons into silicon dioxide - Generation of fast and slow interface states
- S.K. Lai
- D.R. Young
- 1981
- Journal of Applied Physics