Reliability study of a 128Mb phase change memory chip implemented with doped Ga-Sb-Ge with extraordinary thermal stability
- W. Chien
- Huai-Yu Cheng
- et al.
- 2016
- IEDM 2016
Conference paper
Publications
16 results at IEDM 2016
Contact resistivities in gamma-valley materials
- Paul Solomon
- 2016
- IEDM 2016
Conference paperCMOS compatible MIM decoupling capacitor with reliable sub-nm EOT high-k stacks for the 7 nm node and beyond
- Takashi Ando
- Eduard Cartier
- et al.
- 2016
- IEDM 2016
Conference paperLocal thermometry of self-heated nanoscale devices
- F. Menges
- Fabian Motzfeld
- et al.
- 2016
- IEDM 2016
Conference paperHigh-Q magnetic inductors for high efficiency on-chip power conversion
- Naigang Wang
- Bruce Doris
- et al.
- 2016
- IEDM 2016
Conference paperHot carrier effect in ultra-scaled replacement metal gate Sii-xGex channel p-FinFETs
- Miaomiao Wang
- X. Miao
- et al.
- 2016
- IEDM 2016
Conference paper