Silicon nitride trap properties as revealed by charge-centroid measurements on MNOS devices
- P.C. Arnett
- B.H. Yun
- 2008
- Applied Physics Letters
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5 results for B.H. Yun
Electron and hole transport in CVD Si3N4 films
- Bob H. Yun
- 2008
- Applied Physics Letters
Effects of electron-beam irradiation on the properties of CVD Si 3N4 films in MNOS structures
- T.P. Ma
- B.H. Yun
- et al.
- 2008
- Journal of Applied Physics
Charge injection from polycrystalline silicon into SiO2 at low fields
- B.H. Yun
- T.W. Hickmott
- 2008
- Journal of Applied Physics
Measurements of charge propagation in Si3N4 films
- B.H. Yun
- 2003
- Applied Physics Letters