Skip to main content
Research
Publication
IEEE International SOI Conference 2010
Conference paper

Stacked devices for SEU immune design

IEEE International SOI Conference 2010
View publication

Abstract

A stacked transistor on SOI shows the potential to provide soft error upset immune designs. Key design elements are presented and analyzed showing tradeoffs between standard SOI devices and stacked devices, as well as alternative layouts to optimize soft error upset immunity. ©2010 IEEE.

Date

30 Dec 2010

Publication

IEEE International SOI Conference 2010

Authors

Share