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RADECS 2009
New alpha counters make accurate measurements of low emissivity samples possible. Modeling results set lower limits for measurements at sea level of silicon substrates to about 0.3α khr-cm2. Our measurements demonstrate the effect of cosmic ray shielding on the measured alpha-particle emissivity. A few atoms of radon contamination can cause elevated emissivities many days after exposure. © 1963-2012 IEEE.
James R. Schwank, Marty R. Shaneyfelt, et al.
RADECS 2009
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Applied Physics Letters
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IEEE TNS
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IEEE TNS