Conference paper
Multi-bit upsets in 65nm SOI SRAMs
Ethan H. Cannon, Michael S. Gordon, et al.
IRPS 2008
New alpha counters make accurate measurements of low emissivity samples possible. Modeling results set lower limits for measurements at sea level of silicon substrates to about 0.3α khr-cm2. Our measurements demonstrate the effect of cosmic ray shielding on the measured alpha-particle emissivity. A few atoms of radon contamination can cause elevated emissivities many days after exposure. © 1963-2012 IEEE.
Ethan H. Cannon, Michael S. Gordon, et al.
IRPS 2008
Matthew Copel, Marcelo A. Kuroda, et al.
Nano Letters
Michael S. Gordon, Kenneth P. Rodbell, et al.
IEEE TNS
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Applied Physics Letters