Hiroyoshi Kawasaki, Brett M. Clark, et al.
IEEE TNS
New alpha counters make accurate measurements of low emissivity samples possible. Modeling results set lower limits for measurements at sea level of silicon substrates to about 0.3α khr-cm2. Our measurements demonstrate the effect of cosmic ray shielding on the measured alpha-particle emissivity. A few atoms of radon contamination can cause elevated emissivities many days after exposure. © 1963-2012 IEEE.
Hiroyoshi Kawasaki, Brett M. Clark, et al.
IEEE TNS
Henry H.K. Tang, Kenneth P. Rodbell
MRS Bulletin
Kenneth P. Rodbell, David F. Heidel, et al.
IEEE TNS
Kenneth P. Rodbell, David F. Heidel, et al.
IEEE TNS