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Christian Lavoie- A. Quintero
- M. Libera
- et al.
- 1998
- Microscopy and Microanalysis
- F.A. Geenen
- E. Solano
- et al.
- 2018
- Journal of Applied Physics
- F.A. Geenen
- K. Van Stiphout
- et al.
- 2018
- Journal of Applied Physics
- C. Feautrier
- Ahmet S. Ozcan
- et al.
- 2017
- Journal of Applied Physics
- B. De Schutter
- K. Van Stiphout
- et al.
- 2016
- Journal of Applied Physics
- V. Svilan
- K.P. Rodbell
- et al.
- 1997
- Journal of Electronic Materials