Direct Partition Measurement of Parasitic Resistance Components in Advanced Transistor Architectures
- Zuoguang Liu
- Heng Wu
- et al.
- 2019
- VLSI Technology 2019
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7 results for Chen Zhang
Technique for Asymmetric Source/Drain Resistance Extraction on a Single Gate Length MOSFET
- Phil Oldiges
- Chen Zhang
- et al.
- 2018
- SISPAD 2018
FinFET external resistance analysis by extended shift-and-ratio method
- Chen Zhang
- Zuoguang Liu
- et al.
- 2018
- IEEE T-ED
A review of III-V planar nanowire arrays: Selective lateral VLS epitaxy and 3D transistors
- Chen Zhang
- Xin Miao
- et al.
- 2017
- Journal of Physics D: Applied Physics
FinFET performance with Si:P and Ge:Group-III-Metal metastable contact trench alloys
- Oleg Gluschenkov
- Zuoguang Liu
- et al.
- 2016
- IEDM 2016
Sub-10-9 Ω-cm2 n-Type Contact Resistivity for FinFET Technology
- Hiroaki Niimi
- Zuoguang Liu
- et al.
- 2016
- IEEE Electron Device Letters
III-V nanowire transistors for low-power logic applications: A review and outlook
- Chen Zhang
- Xiuling Li
- 2016
- IEEE T-ED