Characteristics of CMOS devices fabricated using high quality thin PECVD gate oxide
- L.K. Wang
- D.S. Wen
- et al.
- 1989
- IEDM 1989
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36 results for T.N. Nguyen
POST OXIDATION ANNEAL AND RE-OXIDATION EFFECTS IN 5 nm SiO//2 FILMS.
- L. Dori
- M. Arienzo
- et al.
- 1986
- MRS Fall Meeting 1986
CHARACTERIZATION OF IC DEVICES FABRICATED IN LOW TEMPERATURE (550 degree C) EPITAXY BY UHV/CVD TECHNIQUE.
- T.N. Nguyen
- D.L. Harame
- et al.
- 1985
- IEDM 1985
Epitaxial base transistors with ultrahigh vacuum chemical vapor deposition (uhv/cvd) epitaxy: Enhanced profile control for greater flexibility in device design
- David L. Harame
- Johannes M.C. Stork
- et al.
- 1989
- IEEE Electron Device Letters
Electrical Characteristics of Very Thin SiO2 Deposited at Low Substrate Temperatures
- J. Batey
- E. Tierney
- et al.
- 1987
- IEEE Electron Device Letters
Document access in a multi-party information management system
- Trieu C. Chieu
- Thao Nguyen
- et al.
- 2008
- SOLI 2008
A software as a service with multi-tenancy support for an electronic contract management application
- Thomas Kwok
- Thao Nguyen
- et al.
- 2008
- SCC 2008
An enterprise electronic contract management system based on service-oriented architecture
- Trieu C. Chieu
- Thao Nguyen
- et al.
- 2007
- SCC 2007
An automatic method to extract data from an electronic contract composed of a number of documents in PDF format
- Thomas Kwok
- Thao Nguyen
- 2006
- CEC/EEE 2006
A secure electronic contract management and process system automated with predefined tasks
- Thomas Kwok
- Thao Nguyen
- 2005
- EEE 2005