PublicationIEEE T-EDPaperTA-A3 Retention Time Studies in Buried-Channel MOSFET Dynamic-Memory DevicesIEEE T-EDView publicationAbstractNo abstract available.Home↳ PublicationsDate01 Jan 1980PublicationIEEE T-EDAuthorsH.H. ChaoR.P. HavrelukIBM-affiliated at time of publicationShare