PublicationIEEE International SOI Conference 2008Conference paperStable high-density FD/SOI SRAM with selective back-gate bias using dual buried oxideIEEE International SOI Conference 2008View publicationAbstractNo abstract available.Home↳ PublicationsDate24 Dec 2008PublicationIEEE International SOI Conference 2008AuthorsKeunwoo KimJente B. KuangFadi GebaraHung C. NgoChing-Te ChuangKevin J. NowkaIBM-affiliated at time of publicationShare
