S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
In this paper we wish to report on our progress in developing a positive TSI system with emphasis on what we believe is a novel approach for characterizing the silylation process. © 1992.
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
R. Ghez, M.B. Small
JES
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films