Alexander Rylyakov, Clint Schow, et al.
ISSCC 2011
Dependence of CMOS performance on silicon crystal orientation of (100), (111), and (110) has been investigated with the equivalent gate dielectric thickness less than 3 nm. Hole mobility enhancement of ≥ 160% has been observed for both oxynitride and HfO2 gate dielectrics on (110) surfaces compared with (100). CMOS drive current is nearly symmetric on (110) orientation without any degradation of subthreshold slope. For HfO2 gate dielectrics, an approximately 68% enhancement of pMOSFET drive current has been demonstrated on (110) substrates at Lpoly = 0.12 μm, while current reduction in nMOS is around 26%.
Alexander Rylyakov, Clint Schow, et al.
ISSCC 2011
Jakub Kedzierski, Diane Boyd, et al.
IEDM 2003
Solomon Assefa, Steven Shank, et al.
IEDM 2012
Jens Hofrichter, William M. J. Green, et al.
GFP 2011