David B. Mitzi
Journal of Materials Chemistry
The ignition and onset latchup events related to I/O circuits were discussed. Latchup events were detected by monitoring the amount of current absorbed by the circuit during its operations. The events leading up to latchup for different I/O pins and the factors affecting the latchup sensitivity of a circuit were also discussed.
David B. Mitzi
Journal of Materials Chemistry
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Sung Ho Kim, Oun-Ho Park, et al.
Small
J.R. Thompson, Yang Ren Sun, et al.
Physica A: Statistical Mechanics and its Applications