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Zeitschrift fur Kristallographie - New Crystal Structures
Conference paper
Latchup Analysis Using Emission Microscopy
Abstract
The ignition and onset latchup events related to I/O circuits were discussed. Latchup events were detected by monitoring the amount of current absorbed by the circuit during its operations. The events leading up to latchup for different I/O pins and the factors affecting the latchup sensitivity of a circuit were also discussed.
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