Fernando Marianno, Wang Zhou, et al.
INFORMS 2021
The ignition and onset latchup events related to I/O circuits were discussed. Latchup events were detected by monitoring the amount of current absorbed by the circuit during its operations. The events leading up to latchup for different I/O pins and the factors affecting the latchup sensitivity of a circuit were also discussed.
Fernando Marianno, Wang Zhou, et al.
INFORMS 2021
R. Ghez, M.B. Small
JES
D.D. Awschalom, J.-M. Halbout
Journal of Magnetism and Magnetic Materials
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997