CICC 2013
Conference paper

Indirect performance sensing for on-chip analog self-healing via Bayesian model fusion

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On-chip analog self-healing requires low-cost sensors to accurately measure various performance metrics. In this paper we propose a novel approach of indirect performance sensing based upon Bayesian model fusion (BMF) to facilitate inexpensive-yet-accurate on-chip performance measurement. A 25GHz differential Colpitts voltage-controlled oscillator (VCO) designed in a 32nm CMOS SOI process is used to validate the proposed indirect performance sensing and self-healing methodology. Our silicon measurement results demonstrate that the parametric yield of the VCO is improved from 0% to 69.17% for a wafer after the proposed self-healing is applied. © 2013 IEEE.