About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Publication
IRPS 2024
Conference paper
General Statistical Model for Dielectric Breakdown Including Reverse Area Scaling - The Role of Area-Dependent Dynamic Competition
Abstract
In this work, we present a general statistical model using the joint Weibull-Fréchet distribution for dielectric breakdown (BD) including the reverse area scaling trend reported recently [1], [2]. This model only uses four parameters and is capable of well capturing the experimental data. By demonstrating its equivalence to the physics-based statistical model [1], [2], we show it can quickly extract the parameters of the physics-based model. Moreover, it can be used in reliability prediction as we demonstrate the general applicability of this model to capture a wide variety of scaling trends from conventional to reverse area dependence of dielectric BD. We outline important notion of area dependent dynamic competition (ADDC) process and discuss various controversies involving modern modeling approaches to simulate BD filament formation in consideration of ADDC process.