Publications

This is our catalog of recent publications authored by IBM researchers, in collaboration with the global research community. We’re currently adding our back catalog of more than 110,000 publications. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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25 results for Ernest Y. Wu

Fundamental limitations of existing models and future solutions for dielectric reliability and RRAM applications (invited)
- - Ernest Y. Wu
  - Andrew Kim
  - et al.
- 2017
- IEDM 2017
Comprehensive model for progressive breakdown in nFETs and pFETs
- - S. Lombardo
  - Ernest Y. Wu
  - et al.
- 2016
- IEDM 2016
Multiple breakdown phenomena and modeling for non-uniform dielectric systems
- - Ernest Y. Wu
  - Baozhen Li
  - et al.
- 2014
- IEDM 2014
Reliability challenges for the 10nm node and beyond
- - James Stathis
  - Miaomiao Wang
  - et al.
- 2014
- IEDM 2014
Resistive Random Access Memory Filament Visualization and Characterization Using Photon Emission Microscopy
- - Franco Stellari
  - Ernest Y. Wu
  - et al.
- 2021
- IEEE Electron Device Letters
Resistive Memory Process Optimization for High Resistance Switching Toward Scalable Analog Compute Technology for Deep Learning
- - Youngseok Kim
  - Soon-Cheon Seo
  - et al.
- 2021
- IEEE Electron Device Letters
Photon Emission Microscopy of Amorphous HfO2 ReRAM Cells
- - Franco Stellari
  - Leonidas E. Ocola
  - et al.
- 2022
- IPFA 2022
A Flexible and Inherently Self-Consistent Methodology for MOL/BEOL/MIMCAP TDDB Applications with Excessive Variability-Induced Degradation
- - Ernest Wu
  - Ron Bolam
  - et al.
- 2022
- IRPS 2022
Quantum Mechanical Connection of Schottky Emission Process and Its implications on Breakdown Methodology and Conduction Modeling for BEOL Low-k Dielectrics
- - Ernest Wu
  - Baozhen Li
- 2022
- IRPS 2022
TDDB Reliability in Gate-All-Around Nanosheet
- - Huimei Zhou
  - Miaomiao Wang
  - et al.
- 2021
- IRPS 2021