About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Paper
Characterization of the structure of Langmuir-Blodgett films by short-wavelength radiations
Abstract
A review is given of the methods of determining the structure of organic thin films using short-wavelength radiations. These include X-rays, electrons and neutrons. Most of the methods involve diffraction and interference effects, of either traveling or standing waves. In addition, direct imaging techniques are also mentioned. Particular emphasis is given to the structure of Langmuir-Blodgett films but the applicability extends to thin polymer films as well. Some trends of the research in this field are identified. © 1987.