S. Bangsaruntip, G.M. Cohen, et al.
IEDM 2009
Paper
Precision, double XTEM sample preparation of site specific Si nanowires
Abstract
No abstract available.
Related
Workshop paper
Electromigration challenges for nanoscale Cu wiring
C.-K. Hu, L. Gignac, et al.
International Workshop on Stress-Induced Phenomena in Metallization 2008
C.-K. Hu, L. Gignac, et al.
JES
C.-K. Hu, L. Gignac, et al.
Applied Physics Letters