PublicationMicroscopy and MicroanalysisPaperPrecision, double XTEM sample preparation of site specific Si nanowiresMicroscopy and MicroanalysisDownload paperAbstractNo abstract available.Home↳ PublicationsDate26 Jul 2009PublicationMicroscopy and MicroanalysisAuthorsL. GignacS. MittalS. BangsaruntipG.M. CohenJ. SleightIBM-affiliated at time of publicationResourcesPublicationShare
