PaperMechanisms for microstructure evolution in electroplated copper thin films near room temperatureJ.M.E. Harper, C. Cabral Jr., et al.Journal of Applied Physics
PaperHigh energy BSE/SE/STEM imaging of 8 um thick semiconductor interconnectsL. Gignac, C. Beslin, et al.Microscopy and Microanalysis
Conference paperHigh performance and highly uniform gate-all-around silicon nanowire MOSFETs with wire size dependent scalingS. Bangsaruntip, G.M. Cohen, et al.IEDM 2009
Conference paperTunable Workfunction for Fully Silicied Gates (FUSI) and Proposed MechanismsY.-H. Kim, C. Cabral Jr., et al.VLSI-TSA 2006
