About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Publication
Applied Physics Letters
Paper
A technique for comparing the bulk and surface structure of defects in thin films using the scanning transmission electron microscope.
Abstract
A technique is described which allows the scanning transmission electron microscope to be operated either in its usual mode to give a transmission image from a thin film, or with a tilted sample to give a low-loss image of the surface. The low-loss image obtained from one surface of a thin-film gold sample is compared with the bright field image of the same area. Microtwins in this film display strong topographic contrast on the single surface studied. From this, it appears that the microtwins are formed by deformation, rather than as growth accidents during the preparation of the sample. It is found advantageous in the low-loss mode to operate with a less steeply tilted sample than heretofore.