Low loss surface imaging and transmission microscopy of growth of some thin films
- D.A. Smith
- M.M.J. Treacy
- 1982
- Applications of Surface Science
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A technique for comparing the bulk and surface structure of defects in thin films using the scanning transmission electron microscope.
- M.M.J. Treacy
- W. Krakow
- et al.
- 1981
- Applied Physics Letters