IEEE Electron Device Letters

A Josephson Technology System Level Experiment

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This letter describes the first system level test vehicle in Josephson technology. The experiment consists of four circuit chips assembled on two cards in a high density, 3-dimensional, card-on-board package. A data path, which is representative of a critical path of a future prototype processor, was successfully operated with a minimum cycle time of 3.7ns. The path simulates a jump control sequence and a cache access in each machine cycle. This experiment incorporates the essential components of the logic, power and package portions of a Josephson technology prototype. Copyright © 1981 by The Institute of Electrical and Electronics Engineers, Inc.