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Derrick Liu
Overview
Title
Software Developer
Location
IBM Research - Yorktown Heights Yorktown Heights, NY USA
Patents
21 Mar 2022
US
11282186
Anomaly Detection Using Image-based Physical Characterization
06 Dec 2021
US
11195969
Method Of Forming A Metal Silicide Transparent Conductive Electrode
05 Jul 2021
US
11056610
Method Of Forming A Metal Silicide Transparent Conductive Electrode
25 May 2020
US
10664966
Anomaly Detection Using Image-based Physical Characterization
29 Oct 2019
GB
2556224
Semiconductor Structure And Process
15 Apr 2019
US
10263098
Threshold Voltage Modulation Through Channel Length Adjustment
04 Mar 2019
US
10224419
Threshold Voltage Modulation Through Channel Length Adjustment
31 Dec 2018
US
10170593
Threshold Voltage Modulation Through Channel Length Adjustment
31 Dec 2018
US
10170477
Forming Mosfet Structures With Work Function Modification
03 Dec 2018
US
10147725
Forming Mosfet Structures With Work Function Modification
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