Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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18 results at IEEE Transactions on Reliability

Multiple-phase modeling of degradation signal for condition monitoring and remaining useful life prediction
- - Yuxin Wen
  - Jianguo Wu
  - et al.
- 2017
- IEEE Transactions on Reliability
A Hierarchical Model for Lithium-Ion Battery Degradation Prediction
- - Xin Xu
  - Zhiguo Li
  - et al.
- 2016
- IEEE Transactions on Reliability
Planning accelerated life tests under scheduled inspections for log-location-scale distributions
- - Xiao Liu
  - Loon-Ching Tang
- 2013
- IEEE Transactions on Reliability
Comparison of the mean time between failures for two systems under short tests
- - Yefim H. Michlin
  - Genady Ya. Grabarnik
  - et al.
- 2009
- IEEE Transactions on Reliability
Sequential testing for comparison of the mean time between failures for two systems
- - Yefim H. Michlin
  - Genady Ya Grabarnik
- 2007
- IEEE Transactions on Reliability
Approximations for the renewal function
- - Amit Garg
  - Jayant R. Kalagnanam
- 1998
- IEEE Transactions on Reliability
Automatic test-generation for predicates
- - Amit Paradkar
  - Ibm T. J. Watson
  - et al.
- 1996
- IEEE Transactions on Reliability
Estimating component-defect probability from masked system success/failure data
- - Benjamin Reiser
  - Betty J. Flehinger
  - et al.
- 1996
- IEEE Transactions on Reliability
What Is Software Failure ?
- - Ram Chillarege
- 1996
- IEEE Transactions on Reliability
The Effect of Memory-Management Policies on System Reliability
- - Nicholas S. Bowen
  - Dhiraj K. Pradhan
- 1993
- IEEE Transactions on Reliability