Betty J. Flehinger, Marek Kimmel, et al.
Journal of the National Cancer Institute
Summary & Conclusions - Consider a system of k components that fails whenever there is a defect in at least one of the components. Due to cost & time constraints it is not feasible to learn exactly which components are defective. Instead, test procedures ascertain that the defective components belong to some subset of the k components. This phenomenon is termed masking. We describe a 2-stage procedure in which a sample of masked subsets is subjected to intensive failure analysis. This enables maximum-likelihood estimation of the defect probability of each individual component and leads to diagnosis of the defective components in future masked failures. © 1996 IEEE.
Betty J. Flehinger, Marek Kimmel, et al.
Journal of the National Cancer Institute
Andrew R. Conn, Nicholas I. M. Gould, et al.
Mathematical Programming, Series B
Sonia Cafieri, Andrew R. Conn, et al.
EJOR
Brage Rugstad Knudsen, Ignacio E. Grossmann, et al.
Computers & Chemical Engineering