Chandu Visweswariah, Ruud A. Haring, et al.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Summary & Conclusions - Consider a system of k components that fails whenever there is a defect in at least one of the components. Due to cost & time constraints it is not feasible to learn exactly which components are defective. Instead, test procedures ascertain that the defective components belong to some subset of the k components. This phenomenon is termed masking. We describe a 2-stage procedure in which a sample of masked subsets is subjected to intensive failure analysis. This enables maximum-likelihood estimation of the defect probability of each individual component and leads to diagnosis of the defective components in future masked failures. © 1996 IEEE.
Chandu Visweswariah, Ruud A. Haring, et al.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Myron R. Melamed, Betty J. Flehinger, et al.
Cancer
Benjamin Reiser, Emmanuel Yashchin, et al.
Nonlinear Analysis, Theory, Methods and Applications
Andrew R. Conn, Katya Scheinberg, et al.
SIAM Journal on Optimization