Latchup Analysis Using Emission Microscopy
Franco Stellari, Peilin Song, et al.
Microelectronics Reliability
Researchers developed an advanced automation and control software package to automatically acquire large sets of images from different positions of a chip using air-gap objectives and then mathematically stitch them together to create a high-resolution image with a very large field of view (FOV). A key component of this technology was the development of a generic software interface to several analytical tools, so that key functionalities of the tools, such as stage movement, instrument condition setup, and data collection, could be operated in a programmatic way from other dedicated software packages or from different tools involved in the experiment. These interfaces functioned without a software application programming interface (API) from the tool vendor, and they could be addressed using other software and over the network.
Franco Stellari, Peilin Song, et al.
Microelectronics Reliability
Franco Stellari, Peilin Song, et al.
IEEE ITC 2009
Peilin Song, Franco Stellari, et al.
IEEE ITC 2005
Brian L. Ji, Dale J. Pearson, et al.
IEEE Trans Semicond Manuf