Publications

5 results at VLSI Technology 2008

On the dynamic resistance and reliability of phase change memory
- - B. Rajendran
  - M.H. Lee
  - et al.
- 2008
- VLSI Technology 2008
Conference paper
On implementation of embedded Phosphorus-doped SiC stressors in SOI nMOSFETs
- - Zhibin Ren
  - G. Pei
  - et al.
- 2008
- VLSI Technology 2008
Conference paper
Higher hole mobility induced by twisted Direct Silicon Bonding (DSB)
- - M. Hamaguchi
  - H. Yin
  - et al.
- 2008
- VLSI Technology 2008
Conference paper
FinFET performance advantage at 22nm: An AC perspective
- - M. Guillorn
  - J. Chang
  - et al.
- 2008
- VLSI Technology 2008
Conference paper
A cost effective 32nm high-K/metal gate CMOS technology for low power applications with single-metal/gate-first process
- - X. Chen
  - S. Samavedam
  - et al.
- 2008
- VLSI Technology 2008
Conference paper