Spectroscopic characterization of fluorinated silicon single crystal surfacesJ.F. MorarF.R. McFeely1984JVSTAPaper
Raman Spectroscopy of Silicide Formation at the Pt/Crystalline Si InterfaceJ.C. TsangG.W. Rubloffet al.1984JVSTAPaper
Summary Abstract: Electromigration studies of al-intermetallic structuresT. KwokP.S. Hoet al.1984JVSTAPaper
Interfacial Reaction During Metallization of Cured Polyimide: An XPS StudyN.J. ChouC.H. Tang1984JVSTAPaper
Ab initio studies of He-Ni and He-Cu interaction potentialsH.O. BeckmannJ.L. Whittenet al.1984JVSTAPaper
A simple bearing for horizontal rotation of heavy equipment in UHVW. StockerK.H. Rieder1984JVSTAPaper