CMOS scaling into the nanometer regime
- Yuan Taur
- Douglas A. Buchanan
- et al.
- 1997
- Proceedings of the IEEE
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104 results for David J. Frank
Scaling silicon MOS devices to their limits
- S.J. Wind
- D.J. Frank
- et al.
- 1996
- Microelectronic Engineering
CMOS scaling into the 21st century: 0.1 μm and beyond
- Y. Taur
- Y. Mii
- et al.
- 1995
- IBM J. Res. Dev
IIA-7 Monte Carlo Simulations of p-and n-Channel Dual-Gate Si MOSFET's at the Limits of Scaling
- D.J. Frank
- S.E. Laux
- et al.
- 1993
- IEEE Transactions on Electron Devices
Empirical fit to band discontinuities and barrier heights in III-V alloy systems
- Sandip Tiwari
- David J. Frank
- 1992
- Applied Physics Letters
Strained quantum well valence-band structure and optimal parameters for AlGaAs-InGaAs-AlGaAs p-channel field-effect transistors
- B. Laikhtman
- R.A. Kiehl
- et al.
- 1991
- Journal of Applied Physics
Optimal parameters for AlGaAs-InGaAs-AlGaAs p-channel field-effect transistors
- B. Laikhtman
- R.A. Kiehl
- et al.
- 1991
- Applied Physics Letters
Superconductor - semiconductor hybrid transistors
- D.J. Frank
- 1990
- Cryogenics
Analysis of the Operation of GaAlAs/GaAs HBT's
- Sandip Tiwari
- David J. Frank
- 1989
- IEEE T-ED
Noise model for the superconducting-base semiconductor-isolated transistor
- A. Davidson
- D.J. Frank
- 1989
- IEEE Transactions on Magnetics