Publications

This is our catalog of recent publications authored by IBM researchers, in collaboration with the global research community. We’re currently adding our back catalog of more than 110,000 publications. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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26 results for Ernest Y. Wu

Facts and Myths of Dielectric Breakdown Processes-Part II: Post-Breakdown and Variability
- - Ernest Y. Wu
- 2019
- IEEE T-ED
Facts and Myths of Dielectric Breakdown Processes-Part I: Statistics, Experimental, and Physical Acceleration Models
- - Ernest Y. Wu
- 2019
- IEEE T-ED
Recommended Methods to Study Resistive Switching Devices
- - Mario Lanza
  - H.-S. Philip Wong
  - et al.
- 2018
- Advanced Electronic Materials
Electron energy dissipation model of gate dielectric progressive breakdown in n- and p-channel field effect transistors
- - S. Lombardo
  - Ernest Y. Wu
  - et al.
- 2017
- Journal of Applied Physics
Applications of clustering model to bimodal distributions for dielectric breakdown
- - Ernest Y. Wu
  - Ronald Bolam
  - et al.
- 2017
- JVSTB
Boron nitride as two dimensional dielectric: Reliability and dielectric breakdown
- - Yanfeng Ji
  - Chengbin Pan
  - et al.
- 2016
- Applied Physics Letters