Comparison of transient and static test methods for chip-to-sink thermal interface characterizationB. SmithT. Brunschwileret al.2009Microelectronics Journal
Toward zero-emission data centers through direct reuse of thermal energyT. BrunschwilerB. Smithet al.2009IBM J. Res. Dev
Design of thermal interfaces with embedded microchannels to control bond line formationBrian SmithHugo Rothuizenet al.2008ITherm 2008
Forced convective interlayer cooling in vertically integrated packagesThomas BrunschwilerBruno Michelet al.2008ITherm 2008
Interlayer cooling potential in vertically integrated packagesT. BrunschwilerBruno Michelet al.2008Microsystem Technologies
High-performance thermal interface technology overviewR. LindermanT. Brunschwileret al.2007THERMINIC 2007
Utility of transient testing to characterize thermal interface materialsB. SmithT. Brunschwileret al.2007THERMINIC 2007
Hierarchical nested surface channels for reduced particle stacking and low-resistance thermal interfacesR. LindermanT. Brunschwileret al.2007SEMI-THERM 2007
Hierarchically nested channels for fast squeezing interfaces with reduced thermal resistanceThomas BrunschwilerUrs Kloteret al.2007IEEE Transactions on Components and Packaging Technologies
Direct liquid jet-impingement cooling with micronsized nozzle array and distributed return architectureThomas BrunschwilerHugo Rothuizenet al.2006ITherm 2006