DropKV: Decoupling Residual-Output Perturbation for Near-Optimal KV-Cache Eviction
- Aozhong Zhang
- Selcuk Gurses
- et al.
- 2026
- ICML 2026
Workshop paper
Publications
40 results for Charlie Liu
Is Finer Better? The Limits of Microscaling Formats in Large Language Models
- Andrea Fasoli
- Monodeep Kar
- et al.
- 2026
- ICLR 2026
Conference paperDeep Compression of Pre-trained Transformer Models
- Naigang Wang
- Chi-Chun Liu
- et al.
- 2022
- NeurIPS 2022
Conference paperStrategies for aggressive scaling of EUV multi-patterning to sub-20 nm features
- A. Dutta
- Jennifer Church
- et al.
- 2020
- SPIE Advanced Lithography 2020
Conference paperMeasuring Local CD Uniformity in EUV vias with scatterometry and machine learning
- Dexin Kong
- Daniel Schmidt
- et al.
- 2020
- SPIE Advanced Lithography 2020
Conference paperExploration of pillar local CDU improvement options for AI applications
- Charlie Liu
- Hao Tang
- et al.
- 2020
- SPIE Advanced Lithography 2020
Invited talkReducing the Impact of Phase-Change Memory Conductance Drift on the Inference of large-scale Hardware Neural Networks
- Stefano Ambrogio
- M. Gallot
- et al.
- 2019
- IEDM 2019
Conference paperLCDU improvement of EUV-patterned vias with DSA
- Jing Guo
- Dustin W. Janes
- et al.
- 2019
- MEMS/NEMS/MOEMS 2019
Conference paperElectrical validation of the integration of 193i and DSA for sub-20nm metal cut patterning
- Chi Chun Liu
- Richard Farrell
- et al.
- 2019
- MEMS/NEMS/MOEMS 2019
Conference paperDirected self-assembly of block copolymers for 7 nanometre FinFET technology and beyond
- Charlie Liu
- Elliott Franke
- et al.
- 2018
- Nature Electronics
Paper