Publications

This is our catalog of recent publications authored by IBM researchers, in collaboration with the global research community. We’re currently adding our back catalog of more than 110,000 publications. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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9 results for Anshul Gupta

Impact of LER on Mismatch in Nanosheet Transistors for 5nm-CMOS
- - Chandan Kumar Jha
  - Charu Gupta
  - et al.
- 2020
- EDTM 2020
Impact of Hot Carrier Stress on RF FOMs in 10-nm Bulk N-Channel FinFETs
- - Anshul Gupta
  - Charu Gupta
  - et al.
- 2019
- IIRW 2019
Comparison of heat outflow in dense sub-14nm contemporary NFETs: Bulk/SOI, inserted-oxide FinFET and nanowire FET
- - Ishita Jain
  - Anshul Gupta
  - et al.
- 2016
- ICEE 2016
Comparison of LER induced mismatch in NWFET and NSFET for 5-nm CMOS
- - Chandan Kumar Jha
  - Pritam Yogi
  - et al.
- 2020
- IEEE J-EDS
Impact of hot-carrier degradation on drain-induced barrier lowering in multifin SOI n-Channel FinFETs with self-heating
- - Charu Gupta
  - Anshul Gupta
  - et al.
- 2020
- IEEE T-ED
Reliability Modeling and Analysis of Hot-Carrier Degradation in Multiple-Fin SOI n-Channel FinFETs With Self-Heating
- - Anshul Gupta
  - Charu Gupta
  - et al.
- 2019
- IEEE T-ED
Modeling of Effective Thermal Resistance in Sub-14-nm Stacked Nanowire and FinFETs
- - Ishita Jain
  - Anshul Gupta
  - et al.
- 2018
- IEEE T-ED
3-D LER and RDF Matching Performance of Nanowire FETs in Inversion, Accumulation, and Junctionless Modes
- - Anil K. Bansal
  - Charu Gupta
  - et al.
- 2018
- IEEE T-ED
Analytical Modeling of Parasitic Capacitance in Inserted-Oxide FinFETs
- - R. Singh
  - Anshul Gupta
  - et al.
- 2017
- IEEE T-ED