Publications

59 results for Tsuyoshi Ide

Cross-Process Defect Attribution using Potential Loss Analysis
- - Ide-San Ide
  - Kohei Miyaguchi
- 2025
- WSC 2025
Wafer Defect Root Cause Analysis with Partial Trajectory Regression
- - Kohei Miyaguchi
  - Masao Joko
  - et al.
- 2025
- ASMC 2025
Sequence-Aware Inline Measurement Attribution for Good-Bad Wafer Diagnosis
- - Kohei Miyaguchi
  - Masao Joko
  - et al.
- 2025
- ASMC 2025
Wafer Defect Root Cause Analysis with Partial Trajectory Regression DM: Big Data Management and Machine Learning
- - Kohei Miyaguchi
  - Masao Joko
  - et al.
- 2025
- ASMC 2025
Impact of Lot Arrival Density Fluctuations on Cycle Time Control IE: Industrial Engineering
- - Masao Joko
  - Kohei Miyaguchi
  - et al.
- 2025
- ASMC 2025
Sequence-Aware Inline Measurement Attribution for Good-Bad Wafer Diagnosis DM: Big Data Management and Machine Learning
- - Kohei Miyaguchi
  - Masao Joko
  - et al.
- 2025
- ASMC 2025
Convergence-Guaranteed Elastic Net Graphical Model Estimation with Applications to Anomaly Localization
- - Dzung T. Phan
  - Matt Menickelly
  - et al.
- 2025
- SDM 2025
Sequential uncertainty quantification with contextual tensors for social targeting
- - Tsuyoshi Idé
  - Keerthiram Murugesan
  - et al.
- 2024
- KAIS
Learning Granger Causality from Instance-wise Self-attentive Hawkes Processes
- - Dongxia Wu
  - Ide-San Ide
  - et al.
- 2024
- AISTATS 2024
Diagnostic spatio-temporal transformer with faithful encoding
- - Jokin Labaien
  - Tsuyoshi Idé
  - et al.
- 2023
- Knowledge-Based Systems