Wafer Defect Root Cause Analysis with Partial Trajectory Regression
- Kohei Miyaguchi
- Masao Joko
- et al.
- 2025
- ASMC 2025
Publications
55 results for Tsuyoshi "Ide-san" Ide
Sequence-Aware Inline Measurement Attribution for Good-Bad Wafer Diagnosis
- Kohei Miyaguchi
- Masao Joko
- et al.
- 2025
- ASMC 2025
Convergence-Guaranteed Elastic Net Graphical Model Estimation with Applications to Anomaly Localization
- Dzung Phan
- Matt Menickelly
- et al.
- 2025
- SDM 2025
Sequential uncertainty quantification with contextual tensors for social targeting
- 2024
- KAIS
Learning Granger Causality from Instance-wise Self-attentive Hawkes Processes
- Dongxia Wu
- Ide-San Ide
- et al.
- 2024
- AISTATS 2024
Diagnostic spatio-temporal transformer with faithful encoding
- Jokin Labaien
- Tsuyoshi Idé
- et al.
- 2023
- Knowledge-Based Systems
Generative Perturbation Analysis for Probabilistic Black-Box Anomaly Attribution
- Tsuyoshi Idé
- Naoki Abe
- 2023
- KDD 2023
Direction Aware Positional and Structural Encoding for Directed Graph Neural Networks
- Yonas Sium
- Georgios Kollias
- et al.
- 2023
- ICASSP 2023
Directed Graph Auto-Encoders
- Georgios Kollias
- Vasileios Kalantzis
- et al.
- 2022
- AAAI 2022
Cardinality-Regularized Hawkes-Granger Model
- Ide-San Ide
- Georgios Kollias
- et al.
- 2021
- NeurIPS 2021