Cross-Process Defect Attribution using Potential Loss Analysis
- Ide-San Ide
- Kohei Miyaguchi
- 2025
- WSC 2025
Conference paper
Publications
61 results for Tsuyoshi Ide
Early Classification method with Time-series Foundation Models
- Shingo Higashiguchi
- Takayuki Katsuki
- et al.
- 2025
- IBISML 2025
PosterImpact of Lot Arrival Density Fluctuations on Cycle Time Control IE: Industrial Engineering
- Masao Joko
- Kohei Miyaguchi
- et al.
- 2025
- ASMC 2025
Conference paperWafer Defect Root Cause Analysis with Partial Trajectory Regression DM: Big Data Management and Machine Learning
- Kohei Miyaguchi
- Masao Joko
- et al.
- 2025
- ASMC 2025
Conference paperWafer Defect Root Cause Analysis with Partial Trajectory Regression
- Kohei Miyaguchi
- Masao Joko
- et al.
- 2025
- ASMC 2025
Conference paperSequence-Aware Inline Measurement Attribution for Good-Bad Wafer Diagnosis DM: Big Data Management and Machine Learning
- Kohei Miyaguchi
- Masao Joko
- et al.
- 2025
- ASMC 2025
Conference paperSequence-Aware Inline Measurement Attribution for Good-Bad Wafer Diagnosis
- Kohei Miyaguchi
- Masao Joko
- et al.
- 2025
- ASMC 2025
Conference paperConvergence-Guaranteed Elastic Net Graphical Model Estimation with Applications to Anomaly Localization
- Dzung T. Phan
- Matt Menickelly
- et al.
- 2025
- SDM 2025
Conference paperSequential uncertainty quantification with contextual tensors for social targeting
- 2024
- KAIS
PaperLearning Granger Causality from Instance-wise Self-attentive Hawkes Processes
- Dongxia Wu
- Ide-San Ide
- et al.
- 2024
- AISTATS 2024
Conference paper