Evidence for a negative electron-electron correlation energy in the dominant deep trapping center in silicon nitride films
- Sean E. Curry
- P. Lenahan
- et al.
- 1990
- Applied Physics Letters
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6 results for David T. Krick
The nature of the dominant deep trap in amorphous silicon nitride films: Evidence for a negative correlation energy
- P. Lenahan
- D.T. Krick
- et al.
- 1989
- Applied Surface Science
Electrically active point defects in amorphous silicon nitride: An illumination and charge injection study
- D.T. Krick
- P. Lenahan
- et al.
- 1988
- Journal of Applied Physics
Nature of the dominant deep trap in amorphous silicon nitride
- D.T. Krick
- P. Lenahan
- et al.
- 1988
- Physical Review B
Electron-spin-resonance study of defects in plasma-enhanced chemical vapor deposited silicon nitride
- D. Jousse
- Jerzy Kanicki
- et al.
- 1988
- Applied Physics Letters
Stable photoinduced paramagnetic defects in hydrogenated amorphous silicon nitride
- David T. Krick
- P. Lenahan
- et al.
- 1987
- Applied Physics Letters