J. Zhao, G.P. Li, et al.
IEDM 1993
This paper describes advanced Integrated-Schottky-Logic (ISL) circuits featuring double-poly self-alignment, “free” epi-base lateral p-n-p clamp, Selfaligned guard ring Schottky barrier diode, and silicon-filled trench isolation. Using a 0.7-µm-thick epitaxial layer and 1.2-µm minimum dimensions, gate delays of 432 ps (fan-out = 1) and 527 ps (fan-out = 3) are obtained at current levels of 183 and 255 µA/gate, respectively, with nonwalled emitter. With walled emitter (two sides), a gate delay of 382 ps is achieved for fan-out of 3 at a current level of 267 μA/gate. © 1986 IEEE
J. Zhao, G.P. Li, et al.
IEDM 1993
Keunwoo Kim, Ching-Te Chuang, et al.
IEEE International SOI Conference 2002
George A. Sai-Halasz, Matthew R. Wordeman, et al.
IEEE Electron Device Letters
G.P. Li, Tze-Chiang Chen, et al.
IEEE Electron Device Letters