Scanning near-field optical probe with ultrasmall spot size

Abstract

A novel light-emitting probe for scanning near-field optical microscopy is investigated theoretically. The threedimensional vectorial Helmholtz equation is solved for the new probe geometry by using the multiple multipole method. The novel probe consists of a dielectric tip that is entirely metal coated. It provides a single near-field spot that can be smaller than 20 nm (FWHM). The dependence on tip radius, taper angle, and metal thickness in front of the tip is investigated for the power transmission through the probe as well as for the spot size. © 1995, Optical Society of America.