About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Publication
Review of Scientific Instruments
Paper
"Tracking" tunneling microscopy
Abstract
Simple modification of the electronics of a STM allows operation in various tracking modes. Profiles of steepest inclination, equal height, equipotential, electrical field lines, etc., can be traced out. The tunnel tip can also be locked to a surface extremity for indefinite time. Some of these possibilities were tested experimentally.