Conference paper
Overview paper scanning near-field microscopies
D. Pohl, J.K. Gimzewski
Optics in Complex Systems 1990
Simple modification of the electronics of a STM allows operation in various tracking modes. Profiles of steepest inclination, equal height, equipotential, electrical field lines, etc., can be traced out. The tunnel tip can also be locked to a surface extremity for indefinite time. Some of these possibilities were tested experimentally.
D. Pohl, J.K. Gimzewski
Optics in Complex Systems 1990
D. Pohl
Thin Solid Films
B. Hecht, D. Pohl, et al.
Ultramicroscopy
P. Muralt, H.P. Meier, et al.
Superlattices and Microstructures