Scaling dielectric data on Rb1-x(NH4)xH2PO4 structural glasses and their deuterated isomorphs

Abstract

Temperature- (T) and frequency- dependent dielectric losses on Rb1-x(NH4)xH2PO 4 single crystals (RADP), and their deuterated isomorphs (D-RADP), can be collapsed to single curves with a scaling variable E(T). This applies for T sufficiently high that equilibrium is established within the sample-thermalization time. If E(T) follows the Vogel-Fulcher law, the scaling will depend only on the freezing temperature T0 and on the attempt frequency 0. For RADP, values in excellent agreement with a study covering a very broad frequency range are thus obtained, while significantly different values apply to D-RADP. © 1986 The American Physical Society.