About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Publication
Physical Review B
Paper
Scaling dielectric data on Rb1-x(NH4)xH2PO4 structural glasses and their deuterated isomorphs
Abstract
Temperature- (T) and frequency- dependent dielectric losses on Rb1-x(NH4)xH2PO 4 single crystals (RADP), and their deuterated isomorphs (D-RADP), can be collapsed to single curves with a scaling variable E(T). This applies for T sufficiently high that equilibrium is established within the sample-thermalization time. If E(T) follows the Vogel-Fulcher law, the scaling will depend only on the freezing temperature T0 and on the attempt frequency 0. For RADP, values in excellent agreement with a study covering a very broad frequency range are thus obtained, while significantly different values apply to D-RADP. © 1986 The American Physical Society.