Scalable statistical measurement and estimation of a mm wave CML static divider sensitivity in 65nm SOI CMOS

Abstract

A CML static divider operates up to 82.4GHz with 90% yield for 0dBm input is statistically measured and estimated. The proposed method of statistical measurement enables reliable sensitivity curve estimation by 55% of standard variation, based on the analytic model, simulations, and scalable DC and RF measurements for the first time. A 300mm full wafer is scanned for the validation. © 2008 IEEE.