About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Publication
Scanning
Paper
Reduction of edge penetration effect in the scanning electron microscope
Abstract
Electron penetration into the sample in the scanning electron microscope can give rise to bright fringes close to sharp edges in the secondary electron image. This can make it difficult to see details close to the edge. These fringes can be considerably reduced by putting a positive control electrode (CE) between the specimen and the collector. This can be mounted with an insulated clip directly onto the specimen stub. The effectiveness of this technique is demonstrated for the case of a cleaved silicon wafer containing microelectronic structures. The action of the CE is explained in terms of the effective solid angle subtended by the collector at the surface of the specimen. Copyright © 1986 Foundation for Advances in Medicine and Science, Inc.