About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Paper
Prospects for high-resolution electron energy-loss experiments with the scanning transmission electron microscope
Abstract
A brief description of a Wien filter energy-loss spectrometer design for the STEM is given. The performance limit of the device is about 80 meV resolution at 1 mrad semi-angle. At a 12.5 mrad semi-angle referred to the specimen, the total system delivers 0.35 eV resolution, limited mainly by the field emission tunneling width. Various experimental results are compared to results from other spectrometers. © 1985.