R.W. Dreyfus, R.T. Hodgson
IEEE JQE
We have introduced a modest power (50 mW) laser beam into a high resolution scanning transmission electron microscope in order to heat samples to high temperatures and cool them rapidly enough to]] freeze in" the effects of the high temperature. Sequential micrographs of the sample taken after 0.1-s heating pulses show, for example, material migration, grain growth, and crystallization of amorphous silicon evaporated on to 50-nm Si3N4 substrates.
R.W. Dreyfus, R.T. Hodgson
IEEE JQE
P.E. Batson, A.J. Craven
Physical Review Letters
R.T. Hodgson
Physical Review Letters
J.A. Van Vechten, W. Solberg, et al.
Journal of Crystal Growth