T.M. shaw, A. Gupta, et al.
Journal of Materials Research
We have introduced a modest power (50 mW) laser beam into a high resolution scanning transmission electron microscope in order to heat samples to high temperatures and cool them rapidly enough to]] freeze in" the effects of the high temperature. Sequential micrographs of the sample taken after 0.1-s heating pulses show, for example, material migration, grain growth, and crystallization of amorphous silicon evaporated on to 50-nm Si3N4 substrates.
T.M. shaw, A. Gupta, et al.
Journal of Materials Research
P.E. Batson
Ultramicroscopy
P.E. Batson, M.F. Chisholm
Journal of Electron Microscopy Technique
P.E. Batson, G. Trafas
Ultramicroscopy