Conference paper
Soft x-ray diffraction of striated muscle
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
State-of-the-art resist for 193 nm lithography are analyzed with respect to possible resolution, photospeed and etch resistance. This paper describes this photoresist design study and emphasizes the many opportunities and challenges that the photoresist and semiconductor industry face with the unfolding of this technology.
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
William G. Van der Sluys, Alfred P. Sattelberger, et al.
Polyhedron
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
J. Tersoff
Applied Surface Science