Q.R. Huang, Ho-Cheol Kim, et al.
Macromolecules
State-of-the-art resist for 193 nm lithography are analyzed with respect to possible resolution, photospeed and etch resistance. This paper describes this photoresist design study and emphasizes the many opportunities and challenges that the photoresist and semiconductor industry face with the unfolding of this technology.
Q.R. Huang, Ho-Cheol Kim, et al.
Macromolecules
T.N. Morgan
Semiconductor Science and Technology
J.K. Gimzewski, T.A. Jung, et al.
Surface Science
A. Krol, C.J. Sher, et al.
Surface Science