Conference paper
Compression for data archiving and backup revisited
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
State-of-the-art resist for 193 nm lithography are analyzed with respect to possible resolution, photospeed and etch resistance. This paper describes this photoresist design study and emphasizes the many opportunities and challenges that the photoresist and semiconductor industry face with the unfolding of this technology.
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
Ronald Troutman
Synthetic Metals
Robert W. Keyes
Physical Review B
Hiroshi Ito, Reinhold Schwalm
JES